page1
Test Generation
1. Small random circuit
Manual test generation
(100% coverage)
2. 8-bit adder
Manual test generation
(100% coverage)
Nr.
Algorithmic
1
2
3
4
5
6
7
8
9
10
11
12
3. A complex ISCAS’85 benchmark
Nr.
Random
Algorithmic
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Default
Tuned/Compacted
Circuit name:
……………
Nr. of
vectors
Time, s
Cover, %
Cost
Nr. of
vectors
Time, s
Cover, %
Cost
Deterministic
Genetic
Random
Automatic test generation (ATPG)
(100% coverage)
Default
Tuned/Compacted
Nr. of
vectors
Time, s
Nr. of
vectors
Time, s
Deterministic
Genetic
Random
α, β,
and
γ
are to be chosen by the following rules:
- 10 additional test vectors can be justified by 1% of
fault coverage gain;
- we agree to spend 10 seconds more to generate
1-vector shorter test.
Cost = C
v
+ C
t
+ C
%
, where
C
v
=
α
· (Nr. of vectors) – cost of test length,
C
t
=
β
· (Time,s) – cost of test generation time,
C
%
=
γ
· (100% - Cover,%) – cost of fault coverage
name
____________________
matricul. nr.
____________________
group
____________________
0101
2020
0101
2020